Fundamentals of surface and thin film analysis

Summary

Titles

• Full Title: Fundamentals of surface and thin film analysis/ Leonard C. Feldman, James W. Mayer.

Notes

• Bibliogr. en fin de chap. Index.
• An overview : concepts, units, and the Bohr atom -- Atomic collisions and backscattering spectrometry -- Energy loss of light ions and backscattering depth profiles -- Sputter depth profiles and secondary ion mass spectrometry -- Channeling -- Electron- electron interactions and the depth sensivity of electron spectroscopies -- Surface structure -- Photon adsorption in solids and EXAFS -- X-ray photoelectron spectroscopy (XPS) -- Eadiative transitions and the electron microprobe -- Nonradiative transitions and auger electron spectroscopy -- Nuclear techniques : activation analysis and prompt radiation analysis.

Identifiers

• Isbns: 0444009892; 9780444009890; 0135005701; 9780135005705
• Oclc Number: (OCoLC)300409959

Publication Statement

• Place: New York
• Publisher: North-Holland
• Date: 1986

Physical Description

• Extent: xviii, 352 pages :
• Illustrations: illustrations

Table Of Contents

• An overview : concepts, units, and the Bohr atom -- Atomic collisions and backscattering spectrometry -- Energy loss of light ions and backscattering depth profiles -- Sputter depth profiles and secondary ion mass spectrometry -- Channeling -- Electron- electron interactions and the depth sensivity of electron spectroscopies -- Surface structure -- Photon adsorption in solids and EXAFS -- X-ray photoelectron spectroscopy (XPS) -- Eadiative transitions and the electron microprobe -- Nonradiative transitions and auger electron spectroscopy -- Nuclear techniques : activation analysis and prompt radiation analysis.

Subjects

Writers