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Fundamentals of surface and thin film analysis
by Feldmanˌ Leonard C., Mayerˌ James W.
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Summary
Titles
- Full Title: Fundamentals of surface and thin film analysis/ L.C. Feldman, J.W. Mayer.
Identifiers
- Isbns: 0444009892; 9780444009890
- Oclc Number: (OCoLC)924660296
Publication Statement
- Place: New York
- Publisher: North-Holland
- Date: 1986
Physical Description
- Extent: xviii, 352 s. :
- Illustrations: illustrations
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