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Fundamentals of surface and thin film analysis
by Feldmanˌ Leonard C., Mayerˌ James W., North-Holland Publishing Company.
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Book
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Summary
Titles
- Full Title: Fundamentals of surface and thin film analysis/ Leonard C. Feldman, James W. Mayer.
Notes
- Bibliogr. przy rozdz. Indeks.
Identifiers
- Isbns: 0444009892; 9780444009890
- Oclc Number: (OCoLC)804509514
Publication Statement
- Place: New York [etc.]
- Publisher: North-Holland
- Date: 1986
Physical Description
- Extent: XVIII, 352, [2] s. :
- Dimensions: 24 cm.
- Illustrations: il. ;
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