No comments yet.
Fundamentals of surface and thin film analysis
by Feldmanˌ Leonard C., Mayerˌ James W.ˌ
Type
Book
Rate
0.0 /5
Summary
Titles
- Full Title: Fundamentals of surface and thin film analysis/ Leonard C. Feldman, James W. Mayer.
Notes
- Incluye bibliografiu0301a e iu0301ndice.
Identifiers
- Isbns: 0444009892; 9780444009890
- Oclc Number: (OCoLC)912404970
Publication Statement
- Place: New York
- Publisher: North-Holland
- Date: 1986
Physical Description
- Extent: xviii, 352 p. :
- Dimensions: 24 cm
- Illustrations: il. ;
Subjects
Writers
Related Books
more →
L’individu au Moyen Age : individuation et individualisation avant la modernité
Unknown Author
0
Type: Book
Ensuring compliance with multilateral environmental agreements : a dialogue between practitioners and academia
Unknown Author
0
Type: Book
Götterzeichen, Liebeszauber, Satanskult : neue Einblicke in alte Goethetexte
Unknown Author
0
Type: Book
Sellers
-
Simorgh Book
Iran, TehranPride and Prejudice book240 USD -
Book Center
Iran, QomBook Pride and Prejudice245 USD
Rate & Comments