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Fundamentals of Surface and Thin Film Analysis
by Feldmanˌ Leonard C., Mayerˌ James W.
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Summary
Titles
- Full Title: Fundamentals of Surface and Thin Film Analysis/ Leonard C. Feldman, James W. Mayer.
Identifiers
- Isbns: 0444009892; 9780444009890
- Oclc Number: (OCoLC)450002752
Publication Statement
- Place: New York [etc.]
- Publisher: North-Holland
- Date: 1986
Physical Description
- Extent: 352 str.
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