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Fundamentals of surface and thin film analysis

Fundamentals of surface and thin film analysis

by Feldmanˌ Leonard C., Mayerˌ James W.

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Summary

Titles

Full Title: Fundamentals of surface and thin film analysis/ Leonard C. Feldman, James W. Mayer.

Notes

Bibliogr.

Identifiers

Isbns: 0444009892; 9780444009890
Oclc Number: (OCoLC)632869530

Publication Statement

Place: New York ; Amsterdam
Publisher: North-Holland
Date: 1986

Physical Description

Extent: XVIII, 352 Seiten :
Dimensions: 24 cm
Illustrations: figur ;

Subjects

Analyse Dünne Schicht Eigenschaften Dünner Schichten (physik Von Molekularsystemen) Festkörperoberfläche Oberflächen + Grenzflächen + Bruchflächen (physik Von Molekularsystemen) Oberflächenanalyse Physique Des Surfaces Et Des Interfaces + Surfaces De Fracture + Structures Externes (physique Des Systèmes Moléculaires) Properties Of Thin Layers (physics Of Molecular Systems) Propriétés Des Couches Minces (physique Des Systèmes Moléculaires) Surfaces + Interfaces + Fracture Surfaces (physics Of Molecular Systems)

Writers

Feldmanˌ Leonard C. Mayerˌ James W.

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