No comments yet.
Fundamentals of surface and thin film analysis
by Feldmanˌ Leonard C., Mayerˌ James W.ˌ
Type
Book
Rate
0.0 /5
Summary
Titles
- Full Title: Fundamentals of surface and thin film analysis/ Leonard C. Feldman, James W. Mayer.
Notes
- Includes bibliographies and index.
Identifiers
- Oclc Number: (OCoLC)1310750168
Publication Statement
- Place: New York
- Publisher: North-Holland
- Date: 1986
Physical Description
- Extent: 1 online resource (xviii, 352 pages :
- Illustrations: illustrations)
Subjects
Writers
Related Books
more →
L’individu au Moyen Age : individuation et individualisation avant la modernité
Unknown Author
0
Type: Book
Ensuring compliance with multilateral environmental agreements : a dialogue between practitioners and academia
Unknown Author
0
Type: Book
Götterzeichen, Liebeszauber, Satanskult : neue Einblicke in alte Goethetexte
Unknown Author
0
Type: Book
Sellers
-
Simorgh Book
Iran, TehranPride and Prejudice book240 USD -
Book Center
Iran, QomBook Pride and Prejudice245 USD
Rate & Comments