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Fundamentals of surface and thin film analysis : by Leonard C. Feldman and James W. Mayer.
by Feldmanˌ Leonard C., Mayerˌ James W.
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Book
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Summary
Titles
- Full Title: Fundamentals of surface and thin film analysis : by Leonard C. Feldman and James W. Mayer.
Notes
- Includes bibliographical references and index.
Identifiers
- Isbns: 0444009892; 9780444009890
- Oclc Number: (OCoLC)1109719631
Publication Statement
- Place: New York
- Publisher: Elsevier Science Publishing Co, Inc.
- Date: 1986
Physical Description
- Extent: xviii, 352 pages :
- Dimensions: 23 cm
- Illustrations: illustrations, charts ;
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